Barbara Foster, President and Lead Consultant
Barbara was bitten by the microscopy bug over 25 years ago. Since then, she has worked with professional societies (she even founded her own, The Northeastern Association of Microscopists, in the early '80's), manufacturers (including Cambridge/Reichert-Jung, Zeiss, and Sarastro), consulting companies, and, most importantly, thousands of end users. For over 25 years she served as course organizer and a principal lecturer for the American Chemical Society program, "Applied Optical Microscopy." Her many years of experience combining basic principles with direct application can help you to become more productive immediately.
Ms. Foster also writes extensively for the microscopy community. She has been a contributing editor to American Lab and it is not unusual to see one of her articles in other places such as Advanced Imaging, Advanced Materials & Processes, R&D or Microscopy Today. Visit our Library for a collection of her articles and references to her book and other major chapters.
Areas of Specialization: Light microscopy (including Polarized Light and Fluorescence), microspectroscopy, microinterferometry, Image analysis
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Dr. Donald A. Chernoff - Principal Consultant/ Atomic Force Microscopy
With industrial experience in scanning probe microscopy dating back to the mid 1980’s, Dr. Donald A. Chernoff (Ph.D. in Physical Chemistry, University of Chicago) is a true SPM pioneer. He was the first user outside Digital Instruments (DI) to make a phase image while tapping on a surface and quickly realized the importance of phase contrast to material analyses. Dr. Chernoff’s significant contributions in the area of laser spectroscopy and optics, electron microscopy and the practical application of microscopy to process improvement have resulted in over 40 publications and patents, including the invention of a calibration and measurement procedure that helped make DVDs possible. These protocols now support more than half the world’s production of digital video discs.
As with all MME instructors, Don emphasizes a practical, hands-on approach, confirming that each student can not only operate the AFM but also understands how to interpret the images. A significant part of each course is devoted to analysis of client samples.
Dr. Chernoff co-authored the tutorial chapter on AFM in the American Chemical Society polymer characterization handbook, cited in our Library: "Chapter 19: Atomic Force Microscopy”, Donald A. Chernoff and Sergei Magonov, Comprehensive Desk Reference of Polymer Characterization and Analysis, R. Brady, ed., Oxford University Press, New York. 2003.
Areas of Specialization: Atomic Force and Scanning Probe Microscopy, including Tapping Mode height and phase imaging, Electric Force, Surface Potential, Magnetic Force, Friction; High accuracy calibration and measurement.
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